26 - 27 June 2001: DSP Test Techniques seminar. Hosted by Gordon Roberts, McGill University
13 June 2001   

DSP Test Techniques Presenter: Prof Gordon Roberts , McGill University Venue: Institute for System Level Integration Date: 26-27 June 2001

Course Description

Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Complex digital circuits are now commonly combined with analog circuits as part of the continuting drive toward higher and higher levels of electronic system integration. For example, highly complex microprocessors are frequently combined with high performance analog and mixed-signal circuits to form so-called 'system on a chip' devices. An example of this is a single chip modem combining a Digital Signal Processor with precision analog-to-digital and digital-to-analog functions on a single silicon die. Such devices offer the semiconductor customer significant savings in manufacturing costs due to the resulting of chip-to-chip interconnects.

Course Content

Day 1: Theory of DSP-based Test Techniques
Presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in the mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitisers in a mixed-signal tester. Coherent multitone sample sets are also introduced as an introduction to DSP based testing. Sample theory concepts and DSP bsed testing methodologies are introduced, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering and other DSP based testing fundamentals.

Day 2: Test Metrics and Relationship to DSP Measures
Describes how basic AC channel tests can be performed economically using DSP based testing. Demonstrates non-sampled channels consisting of combinations of op amps, analog filters, programmable gain amplifiers (PGAs) and other continuous-time circuits. Applies many of the same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers etc. Concludes by describing how the basic accuracy of ATE test equipment can be extended using specialised software routines.

Who should attend?
This course assumes a solid background in analog and digital circuits, as well as a knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary.

Presenter
Gordon W Roberts received his PhD degree from the University of Toronto, Canada in 1989. He is currently an associate professor in the Department of Electrical and Computer Engineering, and the Director of the Microelectronics and Computer Systems Laboratory (MACS), both at McGill University.

Dr Roberts has conducted extensive research on analog integrated circuit design and mixed-signal test issues. He has published over 100 papers, co-authored several textbooks related to mixed-signal test and analog integrated circuit design, and contributed 10 chapters to other books. He is past associate editor of the IEEE Transactions on Circuits and Systems, Part II, and an associate editor for the IEEE Design and Test of Computers Magazine.

Registration and Contact Details
Further information is available from George Bell, Test Education Programme Director, Tel: 01506 469310 (direct) or email test@sli-institute.ac.uk

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